Nanotest Hungary Kft.

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Címlap Alkalmazási területek Ásvány-, és kőzettan

Identifying very small amounts of (geo)material

Dr. Joel Sparks, Laboratory Manager, Department of Earth Sciences at Boston University reports:

One area in which the Rigaku MiniFlex seems to be a hit is identifying very small amounts of (geo)material. When I put together the initial MiniFlex order I must have really guessed right when ordering the zero-background holder. It's really been the most scientifically useful holder so far. 

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Elemental mapping of white ammonite with SQX using small-spot analysis capability of ZSX Primus II

An ammonoid is an extinct cephalopod that first appeared in the Late Silurian to Early Devonian Periods (approx. 400 million years ago) and became extinct at the end of the Cretaceous Period (65 million years ago) as did the dinosaurs. (Drawing-1)

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In-situ analysis: High temperature · Low temperature · Variable humidity · Reactive gases · Combined XRD/DSC

The ability to measure samples under specific non-ambient conditions is essential in the research and development of many advanced materials. The Ultima IV has a wide range of fully integrated non-ambient configurations, including the world's only commercially available combined XRD/DSC system.

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Reitveld refinements from an as-obtained rock chunk

Rietveld refinements results, using Rigaku's Ultima IV multipurpose diffraction system, were obtained from a solid rock chunk sample (Figure 1&2) composed of six mineral phases. The XRD data was collected in both the parallel and para-focusing beam geometry.

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X-ray microdiffraction of the crystalline structure forming a tooth

X-ray diffraction measurements of enamel and dentin, which are the major tissues of a tooth, indicate that they are mostly made of hydroxyapatite. It is not very well known that external treatments, such as laser irradiation, may alter the structure of these components. X-ray microdiffraction is useful to observe the localized influence of laser irradiation on the enamel.
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Comparison of wavelength dispersive X-ray fluorescence and energy dispersive X-ray fluorescence techniques

The wavelength-dispersive fluorescence technique (Primini red lines below) has superior resolution and sensitivity, when compared to the alternative energy-dispersive fluorescence method ("EDX" blue lines below). For example, figure below displays the resolving power of the wavelength technique in the area of the titanium (Ti-KA) and barium (Ba-LA) overlap with two distinct peaks, distinguishing it from the amorphous scatter seen in the energy peak at the same region. 

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Bringing XRD experiments into the teaching laboratory

Materials Science has become an essential part of both industrial and academic research. At today's universities the education of future material scientists is essential to help further on going technological advancement. As part of this course of study hands on experience with IR, Raman, TEM, SEM and XRD measurement techniques is important in teaching students the skills required for the analysis of advanced materials. 

The MiniFlex II benchtop XRD system is an easy-to-use, cost-effective way to bring XRD experiments into the teaching laboratory.

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RIR-based quantitative phase analysis of crystal polymorphism

TiO2 is widely used in white pigments, electronics materials, optical catalysts and UV absorbents. It exists in three polymorphs: rutile, anatase and brookite. The efficiencies of rutile and anatase as optical catalysts are different, so a method to determine the rutile:anatase ratio is needed. The quickest way to do quantitative XRD analysis is to determine the RIR (Relative Intensity Ratio).

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Unit cell refinement of Montmorillonite clay using the Rietveld method

Clays such as Montmorillonite present a unique challenge in unit cell and structure refinement due to their layered structures. The semi - crystalline nature of these materials, stemming from the disorder associated with the layered structures, gives rise to broadly asymmetric peak profiles that can be difficult to interpret.
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Supermini asztali WDXRF spektrométer


WDXRF teljesítmény asztali méretben a F-U elemtartomány mérésére

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RIGAKU - Innovatív megoldások a röntgenspektrometriában: A Total Reflexiós Röntgenspektrometria újszerű alkalmazásai

A RIGAKU Corporation röntgenspektrometria területén megjelent új fejlesztései közül ezúttal a Total Reflexiós Röntgenspektrometria (TXRF) néhány újszerű alkalmazását szeretnénk bemutatni a RIGAKU új fejlesztésű, asztali TXRF készülékén, a NANOHUNTER készüléken keresztül. A szabadalmaztatott váltható gerjesztő forrásnak és a röntgennyaláb beesési szögének automatizált változtatásával a készülék nem csak az Al - U elemtartomány ppb szintű mérését teszi lehetővé, hanem vékonyrétegek esetén a felületi elemösszetétel, illetve szennyezések mélység szerinti profilja is roncsolás mentesen meghatározható. Ezáltal felületi folyamatok, diffúzió, szegregáció, felületi homogenitás stb. tanulmányozható.           Bővebben...