Nanotest Hungary Kft.

Új, Nagy-felbontású Pordiffraktométer Ka1 geometriával

A RIGAKU Corporation egy új, nagyfelbontásó pordiffraktométer rendszert mutat be, mely a CBO optika és egy új, Johansson típusú kristály (CBO-E) kombinálásával egy rendszeren belül, horizontális mintatartóval, egy egyszerű slit váltással teszi elérhetővé a Bragg-Brentano geometriát, a Konvergens nyaláb geometriát és a Párhuzamos nyaláb geometriát Ka1 nagyfelbontás mellett.

The European Powder Diffraction Conference EPDIC 12, Darmstadt  2010. Augusztus 27 - 30

High-resolution Powder Diffractometer with Ka1 System 

The X-ray diffractometer demonstrates the largest performance by selecting the optimum energy resolution and the optimum optics for application and sample.  The X-ray diffractometer witch we developed, that is, the SmartLab can install a parabolic multilayer mirror for parallel-beam optics  (CBO), an ellipsoidal multilayer mirror for convergent-beam optics (CBO-E), a Johansson type crystal for monochromatization of the incident X-rays to the Ka1 (Ka1 system). The optimum optics in the combination of the CBO and the Ka1 system in proportion to the purpose can be easily constructed.  The high-resolution and high-speed measurement is possible with the new CALSA analyzer - Ge(111) high performance compact-multi-crystal analyzer is used [1].The Ka1 system is designed as the position of the focal point of the Johansson type crystal is corresponding to the conventional X-ray source.  Therefore, the CBO system can be used in the same way as the conventional Ka system.  Consequently, the Ka system and the Ka1 system can be easily switched.  The advantage which can carry out all measurements with horizontal sample mounting and the advantage only in the simple exchange of the slit switched to the Bragg-Brentano optics, the convergent-beam optics, the parallel-beam optics have been inherited even in the Ka1 system.Since the diffracted X-rays is not obstructed in the Ka2, the separation of the diffracted X-rays becomes easy in the Ka1 system.  Therefore, the indexing becomes easy, and it can conjugate for the measurement for the unknown structure analysis.It is possible to use the Ka1 monochromatized X-rays by theBragg-Brentano optics and the convergent-beam optics in which the diffracted X-rays focus on the detector plane.   Therefore, the high-speed and high-intensity measurement is possible using the high-speed one-dimensional position sensitive X-ray detector D/teX Ultra.In this paper, we report outline of the optics, high-resoluble

measurement results by the Bragg-Brentano optics using the Ka1 system, measurement results of small samples by convergent-beam optics using the Ka1 system.

The European Powder Diffraction Conference EPDIC 12 will be held in the city of
Darmstadt from 27 to 30 August 2010.

Yoshinori Uejia, Tetsuya Ozawaa, Ryuji Matsuoa,  Takeshi Osakabea, Licai Jiang(b), Boris Verman(b), Schuck Goetz(c), Akihiko Iwata(c)
a Rigaku Corpration , Japanb Rigaku Innovative Technologies Inc.,USA
c Rigaku European Headquarters, Rigaku Corpration ,Germany